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VWR® Hitachi UH4150 UV-VIS/NIR Spectrophotometers

Dodávateľ: HITACHI HIGH TECHNOLOGIES
1J1-0013 1J1-0003
634-0951EA 59121.17 EUR
634-0951 634-0952
VWR® Hitachi UH4150 UV-VIS/NIR Spectrophotometers
Spektrofotometry a fotometry Spektrofotometry UV/Vis
These UV-Vis/NIR spectrophotometers offer enormous flexibility for the evaluation and quality control of solid samples, typically optical components or coated surfaces. They can be configured for non destructive measurements when equipped with relevant accessories for applications such as:

  • Micro sample reflectance
  • Wafer reflectance/transmission
  • Optical thin film reflection
  • Lens transmittance
  • Solar cells and coated glass evaluation

High precision accessories can measure at a range of incident angles.

For coated glass surfaces, the variable angleMore Product Information
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